New Visual Inspection System of Paper & Film

An Intelligent System for Efficient Rigid Film Anticounterfeiting Inspection

New DUV Optical Wafer Inspection System

OVERVIEW: In the midst of the rapid acceleration in the advancement of technology nodes, there is a demand for improved performance of waferinspection systems, namely, greater sensitivity as device size moves toward higher integration and density, newer materials such as ArF resist, Cu wiring and low-k films, and higher throughput with 300-mm-diameter wafers. In response to these demands, Hitac...

Development of Visual Inspection System Based on Vector Analysis Technique

The present paper proposes a new concept of image processing method based on vector representation for visual inspection test. The method was applied to detect defects and extract their profiles from digital 2D image of welded rough surface of the structures aiming at the development of automated visual inspection system. The potential availability of the new technique based on vector represent...

Generalization of an Automated Visual Inspection System (AVIS)

Efforts have been made to utilize AI constructs to identify flaws in the Space Shuttle Main Engine (SSME) faceplate regions. In order to expand the applicability of these algorithms to a larger problem domain, the automatic visual inspection system(AVIS) has been modified to enable a user with little or no image processing background to define a system capable of identifying flaws on a given se...

Visual system for fast and automated inspection of 3D parts

The recent requirement for increased speed in the design and manufacturing of new products led to a rapid evolution of the technics for fast production (rapid prototyping, machining at high speed, etc.). But a significant component did not follow this evolution, that is the dimensional and functional checking process. To automate this significant phase of production, it is necessary to develop ...